MC9S08SG8 Datasheet, PDF (285/310 Pages) Freescale Semiconductor, Inc – Microcontrollers

Appendix A Electrical Characteristics
A.9 Internal Clock Source (ICS) Characteristics
I
Table A-9. ICS Frequency Specifications (Temperature Range = –40 to 125°C Ambient)
Num C
Rating
Symbol
Min
Typical
Max
Unit
1 P Average internal reference frequency - untrimmed
f_{int_ut}
25
32.7
41.66
kHz
2 P Average internal reference frequency - trimmed
f_{int_t}
31.25
—
39.0625 kHz
3 D Internal reference startup time
t_irefst
—
55
100
υs
4 D DCO output frequency range - untrimmed
f_{dco_ut}
25.6
33.48
42.66
MHz
5 D DCO output frequency range - trimmed
f_{dco_t}
32
—
40
MHz
6
D
Resolution of trimmed DCO output frequency at fixed
voltage and temperature (using FTRIM)
∆f_{dco_res_t}
—
± 0.1
± 0.2
%f_dco
7
D
Resolution of trimmed DCO output frequency at fixed
voltage and temperature (not using FTRIM)
∆f_{dco_res_t}
—
± 0.2
± 0.4
%f_dco
8
D
Total deviation of trimmed DCO output frequency over
voltage and temperature
∆f_{dco_t}
—
+ 0.5
-1.0
±2
%f_dco
Total deviation of trimmed DCO output frequency over
9 D _{fixed voltage and temperature range of 0°C to 70 °C}
∆f_{dco_t}
—
± 0.5
±1
%f_dco
10 D _{FLL acquisition time} ¹
t_acquire
1.5
ms
11 D _{DCO output clock long term jitter (over 2mS interval)} ²
C_Jitter
—
0.02
0.2
%f_dco
1 _{This specification applies to any time the FLL reference source or reference divider is changed, trim value changed or changing}
from FLL disabled (FBELP, FBILP) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used as the reference,
this specification assumes it is already running.
2 _{Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum fBUS.}
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V_DD and V_SS and variation in crystal oscillator frequency increase the C_Jitter percentage for a
given interval.
MC9S08SG8 MCU Series Data Sheet, Rev. 0
Freescale Semiconductor
PRELIMINARY
285