EP20K400EFI672-2X Datasheet, PDF (59/117 Pages) Altera Corporation – Programmable Logic Device Family

APEX 20K Programmable Logic Device Family Data Sheet
Figure 32. APEX 20K AC Test Conditions
Device
Output
to Test
System
Note (1)
Device input
rise and fall
times < 3 ns
C1 (includes
JIG capacitance)
Operating
Conditions
Note to Figure 32:
(1) Power supply transients can affect AC measurements. Simultaneous transitions of
multiple outputs should be avoided for accurate measurement. Threshold tests
must not be performed under AC conditions. Large-amplitude, fast-ground-
current transients normally occur as the device outputs discharge the load
capacitances. When these transients flow through the parasitic inductance between
the device ground pin and the test system ground, significant reductions in
observable noise immunity can result.
Tables 23 through 26 provide information on absolute maximum ratings,
recommended operating conditions, DC operating conditions, and
capacitance for 2.5-V APEX 20K devices.
Table 23. APEX 20K 5.0-V Tolerant Device Absolute Maximum Ratings Notes (1), (2)
Symbol
Parameter
Conditions
Min
V _CCINT
V_CCIO
V_I
I_OUT
T_STG
T_AMB
T_J
Supply voltage
DC input voltage
DC output current, per pin
Storage temperature
Ambient temperature
Junction temperature
With respect to ground (3)
No bias
Under bias
PQFP, RQFP, TQFP, and BGA packages,
under bias
Ceramic PGA packages, under bias
–0.5
–0.5
–2.0
–25
–65
–65
Max
3.6
4.6
5.75
25
150
135
135
Unit
V
V
V
mA
°C
°C
°C
150
°C
Altera Corporation
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