W28V400B Datasheet, PDF (39/48 Pages) Winbond – 4M(512K x 8/256K x 16) SMARTVOLTAGE FLASH MEMORY

W28V400B/T
V_DD = 5V ±0.5V, 5V ±0.25V, TA = 0 ° C to +70° C
PARAMETER
SYM.
V_DD = 5V ±0.25V(5)
Min.
Max.
5V ±0.5V(6)
Min.
Max.
UNIT
Write Cycle Time
t_AVAV
85
90
nS
#RESET High Recovery to #CE Going Low
(Note 2)
t_PHEL
1
1
µS
#WE Setup to #CE Going Low
t_WLEL
0
0
nS
#CE Pulse Width
t_ELEH
50
50
nS
#RESET V_HH Setup to #CE Going High
(Note 2)
t_PHHEH
100
100
nS
#WP V_IH Setup to #CE Going High (Note 2)
t_SHEH
100
100
nS
V_PP Setup to #CE Going High (Note 2)
t_VPEH
100
100
nS
Address Setup to #CE Going High (Note 3)
t_AVEH
40
40
nS
Data Setup to #CE Going High (Note 3)
t_DVEH
40
40
nS
Data Hold from #CE High
t_EHDX
0
0
nS
Address Hold from #CE High
t_EHAX
5
5
nS
#WE Hold from #CE High
t_EHWH
0
0
nS
#CE Pulse Width High
t_EHEL
25
25
nS
#CE High to RY/#BY Going Low
t_EHRL
90
90
nS
Write Recovery before Read
t_EHGL
0
0
nS
V_PP Hold from Valid SRD, RY/#BY High
(Note 2, 4)
t_QVVL
0
0
nS
#RESET V_HH Hold from Valid SRD, RY/#BY
High (Note 2, 4)
T_QVPH
0
0
nS
#WP V_IH Hold from Valid SRD, RY/#BY High
(Note 2, 4)
t_QVSL
0
0
nS
#BYTE Setup to #CE Going High (Note 7)
t_FVEH
40
40
nS
#BYTE Hold from #CE High (Note 7)
t_EHFV
85
90
nS
Notes:
1. In systems where #CE defines the write pulse width (within a longer #WE timing waveform), all setup, hold, and inactive #WE
times should be measured relative to the #CE waveform.
2. Sampled, not 100% tested.
3. Refer to Table 4 for valid AIN and DIN for block erase or word/byte write.
4. V_PP should be held at V_PPH1/2/3 (and if necessary #RESET should be held at V_HH) until determination of block erase or
word/byte write success (SR.1/3/4/5 = 0).
5. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Seed Configuration) for
testing characteristics.
6. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard Configuration) for
testing characteristics.
7. If #BYTE switch during reading cycle, exist the regulations separately.
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Publication Release Date: April 11, 2003
Revision A4