W28V400B Datasheet, PDF (25/48 Pages) Winbond – 4M(512K x 8/256K x 16) SMARTVOLTAGE FLASH MEMORY

W28V400B/T
AC Input/Output Test Conditions
2.7
INPUT
1.35
0.0
TEST POINTS
1.35 OUTPUT
AC test inputs are driven at 2.7V for a Logic "1" and 0.0V for a Logic "0". Input timing begins, and output timing ends, at 1.35V.
Input rise and fall times (10% to 90%) <10 nS.
Figure 9. Transient Input/Output Reference Waveform for V_DD = 2.7V to 3.6V
3.0
INPUT
1.5
0.0
TEST POINTS
1.5 OUTPUT
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0". Input timing begins, and output timing ends, at 1.5V.
Input rise and fall times (10% to 90%) <10 nS.
Figure 10. Transient Input/Output Reference Waveform for V_DD = 3.3V ±0.3V and V_DD = 5V ±0.25V
(High Speed Testing Configuration)
2.4
2.0
INPUT
0.8
0.45
TEST POINTS
2.0
OUTPUT
0.8
AC test inputs are driven at VOH (2.4 VTTL) for a Logic "1" and VOL (0.45 VTTL) for a Logic "0." Input timing begins at V_IH (2.0
VTTL) and V_IL (0.8 VTTL). Output timing ends at V_IH and V_IL. Input rise and fall times (10% to 90%) <10 nS.
Figure 11. Transient Input/Output Reference Waveform for V_DD = 5V ±0.5V
(Standard Testing Configuration)
- 25 -
Publication Release Date: April 11, 2003
Revision A4