5962-1123701VXC Datasheet, PDF (3/25 Pages) Texas Instruments – 16-Mb RADIATION-HARDENED SRAM

SMV512K32-SP
www.ti.com
SLVSA21H – JUNE 2011 – REVISED JULY 2013
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
TERMINAL FUNCTIONS
PIN NAME
A[18:0]
DQ[31:0]
E1Z
E2
WZ
GZ
VDD1
VDD2
VSS1
VSS2
MSS
MBE
SCRUBZ
BUSYZ
TYPE
Input
Bidirectional
Input
Input
Input
Input
Power
Power
Power
Power
Input
Bidirectional
Bidirectional
Output
ACTIVE
N/A
N/A
Low
High
Low
Low
N/A
N/A
N/A
N/A
N/A
High
Low
Low
DESCRIPTION
Address
Data input/output
Chip enable - 1
Chip enable - 2
Write enable
Output enable for bidirectional input/output
Power supply (1.8 V)
Power supply (3.3 V)
Ground (core)
Ground (I/O)
Used for setting master/slave selection.
Connect to VSS2 for master operation and
VDD2 for slave operation.
Multiple bit or single bit error indicator
(output - user programmable)
EDAC function select (input)
Master SCRUBZ (output)
Slave SCRUBZ (input)
Master BUSYZ (output)
Slave (do not use)
ABSOLUTE MAXIMUM RATINGS
Over operating free-air temperature range (unless otherwise noted). ⁽¹⁾
VALUE
UNIT
V_DD1
V_DD2
V_I/O
T_STG
P_D
T_J
θ_JC
I_I
DC supply voltage(core)
DC supply voltage (I/O)
Voltage on any pin
Storage temperature
Maximum power dissipation
Maximum junction temperature
Thermal resistance, junction-to-case
DC input current
–0.3 to 2.0
–0.3 to 3.8
–0.3 to 3.8
–65 to 150
1.2
150
5
±5
V
V
V
°C
W
°C
°C/W
mA
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Copyright © 2011–2013, Texas Instruments Incorporated
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