LSM303AGR Datasheet, PDF (14/68 Pages) STMicroelectronics – ultra-low-power 3D accelerometer and 3D magnetometer

Module specifications
LSM303AGR
Symbol
Table 3. Sensor characteristics (continued)
Parameter
Test conditions
Min. Typ.⁽¹⁾ Max. Unit
M_R
LA_ST
M_ST
Top
Magnetic RMS noise⁽⁶⁾
High-performance mode
Linear acceleration self-test
positive difference^{(7) (8) (9)}
Magnetic self-test⁽¹⁰⁾
FS = ±2 g; normal mode
Operating temperature range
mgauss
3
(RMS)
17
360 LSB
15
500 mgauss
-40
+85
°C
1. Typical specifications are not guaranteed.
2. Verified by wafer level test and measurement of initial offset and sensitivity.
3. Measurements are performed in a uniform temperature setup and they are based on characterization data in a limited
number of samples, not measured during final test for production.
4. Typical zero-g level offset value after MSL3 preconditioning.
5. Offset can be eliminated by enabling the built-in high-pass filter.
6. With low-pass filter or offset cancellation enabled.
7. The sign of “Self-test output change” is defined by the ST bit in CTRL_REG4_A (23h), for all axes.
8. “Self-test output change” is defined as the absolute value of:
OUTPUT[LSb]_{(Self-test enabled)} - OUTPUT[LSb]_{(Self-test disabled)}. 1LSb=4mg at 10bit representation, ±2 g full scale.
9. After enabling the ST bit, correct data is obtained after two samples (low-power mode / normal mode) or after eight samples
(high-resolution mode).
10. Magnetic “self-test” is defined as: OUTPUT[gauss]_{(Self-test enabled)} - OUTPUT[gauss]_{(Self-test disabled).}
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