SI4464 Datasheet, PDF (9/56 Pages) Silicon Laboratories – HIGH-PERFORMANCE

Si4464/63/61/60
Table 4. Transmitter AC Electrical Characteristics¹
Parameter
TX Frequency
Range (Si4463/61/60)
Symbol
Test Condition
F_TX
Min Typ Max Unit
850 — 1050 MHz
420 — 525 MHz
284 — 350 MHz
142 — 175 MHz
705 — 960 MHz
TX Frequency
Range (Si4464)
F_TX
353 — 639 MHz
177 — 319 MHz
(G)FSK Data Rate^3,4
4(G)FSK Data Rate^3,4
OOK Data Rate^3,4
Modulation Deviation
Range³
Modulation Deviation
Range (Si4464)³
DR_FSK
DR_4FSK
DR_OOK
f₉₆₀
f₅₂₅
f₃₅₀
f₁₇₅
f₉₆₀
f₆₃₉
f₄₇₉
f₃₁₉
f₂₃₉
f₁₅₉
850–1050 MHz
420–525 MHz
283–350 MHz
142–175 MHz
705–960 MHz
470–639 MHz
353–479 MHz
235–319 MHz
177–239 MHz
119–159 MHz
119 — 159 MHz
0.1 — 500 kbps
0.2 — 1000 kbps
0.1 — 120 kbps
— 1.5 — MHz
— 750 — kHz
— 500 — kHz
— 250 — kHz
— 1.5 — MHz
—
1
— MHz
— 750 — kHz
— 500 — kHz
— 375 — kHz
— 250 — kHz
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section in "1.1. Definition of Test Conditions" on page 14.
2. For applications that use the major bands covered by Si4463/61/60, customers should use those parts instead of
Si4464.
3. Guaranteed by qualification. Qualification test conditions are listed in the "Qualification Test Conditions" section in "1.1.
Definition of Test Conditions" on page 14.
4. The maximum data rate is dependant on the XTAL frequency and is calculated as per the formula:
Maximum Symbol Rate = Fxtal/60, where Fxtal is the XTAL frequency (typically 30 MHz).
5. Default API setting for modulation deviation resolution is double the typical value specified.
6. Output power is dependent on matching components and board layout.
Rev 1.2
9