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SI4464 Datasheet, PDF (8/56 Pages) Silicon Laboratories – HIGH-PERFORMANCE
Si4464/63/61/60
Table 3. Receiver AC Electrical Characteristics1 (Continued)
Parameter
Symbol
Test Condition
Min Typ Max Unit
1-Ch Offset Selectivity,
169 MHz3
C/I1-CH Desired Ref Signal 3 dB above sensitiv- —
ity, BER < 0.1%. Interferer is CW, and
–60
—
dB
1-Ch Offset Selectivity,
450 MHz3
C/I1-CH
desired is modulated with 2.4 kbps
F = 1.2 kHz GFSK with BT = 0.5, RX
—
–58
—
dB
channel BW = 4.8 kHz,
1-Ch Offset Selectivity,
868 / 915 MHz3
C/I1-CH
channel spacing = 12.5 kHz
—
–53
—
dB
Blocking 1 MHz Offset3
1MBLOCK Desired Ref Signal 3 dB above sensitiv- —
–75
—
dB
Blocking 8 MHz Offset3
8MBLOCK
ity, BER = 0.1%. Interferer is CW, and
desired is modulated with 2.4 kbps,
—
–84
—
dB
F = 1.2 kHz GFSK with BT = 0.5,
RX channel BW = 4.8 kHz
Image Rejection3
ImREJ No image rejection calibration. Rejec- —
35
—
dB
tion at the image frequency.
IF = 468 kHz
With image rejection calibration in
—
55
—
dB
Si446x. Rejection at the image fre-
quency. IF = 468 kHz
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section in "1.1. Definition of Test Conditions" on page 14.
2. For applications that use the major bands covered by Si4463/61/60, customers should use those parts instead of
Si4464.
3. Guaranteed by qualification. BER is specified for the 450–470 MHz band. Qualification test conditions are listed in the
"Qualification Test Conditions" section in "1.1. Definition of Test Conditions" on page 14.
4. For PER tests, 48 preamble symbols, 4 byte sync word, 10 byte payload and CRC-32 was used. PER and BER tested
in the 450–470 MHz band.
5. Guaranteed by bench characterization.
8
Rev 1.2