SI4464 Datasheet, PDF (11/56 Pages) Silicon Laboratories – HIGH-PERFORMANCE

Si4464/63/61/60
Table 5. Auxiliary Block Specifications¹
Parameter
Symbol
Test Condition
Min
Typ Max Unit
Temperature Sensor
Sensitivity²
TS_S
—
Low Battery Detector
Resolution
LBD_RES
Microcontroller Clock
Output Frequency Range³
F_MC
Configurable to Fxtal or Fxtal
divided by 2, 3, 7.5, 10, 15, or
30 where Fxtal is the reference
XTAL frequency. In addition,
32.768 kHz is also supported.
Temperature Sensor
Conversion²
TEMP_CT
Programmable setting
XTAL Range⁴
XTAL_Range
30 MHz XTAL Start-Up Time t_30M Using XTAL and board layout in
reference design. Start-up time
will vary with XTAL type and
board layout.
30 MHz XTAL Cap
Resolution²
30M_RES
32 kHz XTAL Start-Up Time²
t_32k
32 kHz Accuracy using
Internal RC Oscillator²
32KRC_RES
POR Reset Time
t_POR
—
32.768K
—
25
—
—
—
—
—
4.5
50
—
3
250
70
2
2500
—
— ADC
Codes/
°C
—
mV
Fxtal Hz
—
ms
32 MHz
—
µs
—
fF
—
sec
—
ppm
5
ms
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section in "1.1. Definition of Test Conditions" on page 14.
2. Guaranteed by qualification. Qualification test conditions are listed in the "Qualification Test Conditions" section in "1.1.
Definition of Test Conditions" on page 14.
3. Microcontroller clock frequency tested in production at 1 MHz, 30 MHz and 32.768 kHz. Other frequencies tested in
bench characterization.
4. XTAL Range tested in production using an external clock source (similar to using a TCXO).
Rev 1.2
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