SI4464 Datasheet, PDF (10/56 Pages) Silicon Laboratories – HIGH-PERFORMANCE

Si4464/63/61/60
Table 4. Transmitter AC Electrical Characteristics¹ (Continued)
Parameter
Modulation Deviation
Resolution^2,5
Modulation Deviation
Resolution (Si4464)³
Output Power Range
(Si4464/63)⁶
Output Power Range
(Si4461)⁶
Output Power Range
(Si4460)⁶
TX RF Output Steps³
TX RF Output Level³
Variation vs. Temperature
TX RF Output Level
Variation vs. Frequency³
Transmit Modulation
Filtering³
Symbol
F_RES-960
F_RES-525
F_RES-350
F_RES-175
F_RES-960
F_RES-639
F_RES-479
F_RES-319
F_RES-239
F_RES-159
P_TX
P_TX61
P_TX60
P_{RF_OUT}
P_{RF_TEMP}
P_{RF_FREQ}
B*T
Test Condition
850–1050 MHz
420–525 MHz
283–350 MHz
142–175 MHz
705–960 MHz
470–639 MHz
353–479 MHz
235–319 MHz
177–239 MHz
119–159 MHz
Using switched current match within
6 dB of max power
–40 to +85 C
Measured across 902–928 MHz
Gaussian Filtering Bandwith Time
Product
Min Typ Max Unit
— ^28.6 —
Hz
— ^14.3 —
Hz
—
9.5 _—
Hz
—
4.7 _—
Hz
— 28.6 —
Hz
— 19.1 —
Hz
— 14.3 —
Hz
—
9.5 —
Hz
—
7.1 —
Hz
—
4.7 —
Hz
–20 — +20 dBm
–40 — +16 dBm
–40 — +13 dBm
—
0.1 —
dB
—
1
—
dB
— 0.5 —
dB
— 0.5 —
Notes:
1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section in "1.1. Definition of Test Conditions" on page 14.
2. For applications that use the major bands covered by Si4463/61/60, customers should use those parts instead of
Si4464.
3. Guaranteed by qualification. Qualification test conditions are listed in the "Qualification Test Conditions" section in "1.1.
Definition of Test Conditions" on page 14.
4. The maximum data rate is dependant on the XTAL frequency and is calculated as per the formula:
Maximum Symbol Rate = Fxtal/60, where Fxtal is the XTAL frequency (typically 30 MHz).
5. Default API setting for modulation deviation resolution is double the typical value specified.
6. Output power is dependent on matching components and board layout.
10
Rev 1.2