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SI4464 Datasheet, PDF (4/56 Pages) Silicon Laboratories – HIGH-PERFORMANCE
Si4464/63/61/60
1. Electrical Specifications
Table 1. DC Characteristics1
Parameter
Symbol
Test Condition
Min Typ Max Unit
Supply Voltage
VDD
Range
1.8 3.3 3.6 V
Power Saving Modes IShutdown
RC Oscillator, Main Digital Regulator,
and Low Power Digital Regulator OFF
— 30 — nA
IStandby
Register values maintained and RC
oscillator/WUT OFF
— 50 — nA
ISleepRC RC Oscillator/WUT ON and all register values main- — 900 — nA
tained, and all other blocks OFF
ISleepXO
Sleep current using an external 32 kHz crystal.2
— 1.7 — µA
ISensor Low battery detector ON, register values maintained, — 1 — µA
-LBD
and all other blocks OFF
IReady
Crystal Oscillator and Main Digital Regulator ON,
all other blocks OFF
— 1.8 — mA
TUNE Mode Current
RX Mode Current
TX Mode Current
(Si4464/63)
ITune_RX
ITune_TX
IRXH
IRXL
ITX_+20
RX Tune, High Performance Mode
TX Tune, High Performance Mode
High Performance Mode
Low Power Mode2
+20 dBm output power, class-E match, 915 MHz,
3.3 V
— 7.2 — mA
— 8 — mA
— 13.7 — mA
— 10.7 — mA
— 85 — mA
+20 dBm output power, class-E match, 460 MHz,
3.3 V
— 75 — mA
+20 dBm output power, square-wave match,
169 MHz, 3.3 V
— 70 — mA
TX Mode Current
(Si4461)
ITX_+16
+16 dBm output power, class-E match, 868 MHz,
3.3 V2
— 43 — mA
ITX_+14
+14 dBm output power, Switched-current match,
868 MHz, 3.3 V2
— 37 — mA
ITX_+13
+13 dBm output power, switched-current match,
868 MHz, 3.3 V2
— 29 — mA
TX Mode Current
(Si4460)
ITX_+10
+10 dBm output power, Class-E match, 868 MHz,
3.3 V2
— 18 — mA
Notes:
1. All specifications guaranteed by production test unless otherwise noted. Production test conditions and max limits are
listed in the "Production Test Conditions" section of "1.1. Definition of Test Conditions" on page 14.
2. Guaranteed by qualification. Qualification test conditions are listed in the “Qualification Test Conditions” section in "1.1.
Definition of Test Conditions" on page 14.
4
Rev 1.2