SI4464 Datasheet, PDF (14/56 Pages) Silicon Laboratories – HIGH-PERFORMANCE

Si4464/63/61/60
1.1. Definition of Test Conditions
Production Test Conditions:
T_A = +25 °C.
V_DD = +3.3 VDC.
TX output power measured at 915 MHz.
External reference signal (XOUT) = 1.0 V_PP at 30 MHz, centered around 0.8 VDC.
Production test schematic (unless noted otherwise).
All TX output levels are referred to the pins of the Si4464/63/61/60 (not the output of the RF module).
All RX input levels are referred to the input of a tuned balun connected to the RX input pins of the
Si4464/63/61/60.
Qualification Test Conditions:
T_A = –40 to +85 °C (Typical T_A = 25 °C).
V_DD = +1.8 to +3.6 VDC (Typical V_DD = 3.3 VDC).
Using TX/RX Split Antenna reference design or production test schematic.
All RF input and output levels referred to the pins of the Si4464/63/61/60 (not the RF module).
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Rev 1.2