AR0130 Datasheet, PDF (31/53 Pages) ON Semiconductor – CMOS Digital Image Sensor

AR0130: 1/3-Inch CMOS Digital Image Sensor
Features
Note:
The above steps are not needed if the sensor is being reset (soft or hard reset) upon
the mode change.
Test Patterns
Note:
The AR0130 has the capability of injecting a number of test patterns into the top of the
datapath to debug the digital logic. With one of the test patterns activated, any of the
datapath functions can be enabled to exercise it in a deterministic fashion. Test patterns
are selected by Test_Pattern_Mode register (R0x3070). Only one of the test patterns can
be enabled at a given point in time by setting the Test_Pattern_Mode register according
to Table 7. When test patterns are enabled the active area will receive the value specified
by the selected test pattern and the dark pixels will receive the value in Test_Pat-
tern_Green (R0x3074 and R0x3078) for green pixels, Test_Pattern_Blue (R0x3076) for
blue pixels, and Test_Pattern_Red (R0x3072) for red pixels.
Turn off black level calibration (BLC) when Test Pattern is enabled.
Table 7:
Test Pattern Modes
Test_Pattern_Mode
0
1
2
3
256
Test Pattern Output
No test pattern (normal operation)
Solid color test pattern
100% color bar test pattern
Fade-to-gray color bar test pattern
Walking 1s test pattern (12-bit)
Color Field
When the color field mode is selected, the value for each pixel is determined by its color.
Green pixels will receive the value in Test_Pattern_Green, red pixels will receive the value
in Test_Pattern_Red, and blue pixels will receive the value in Test_Pattern_Blue.
Vertical Color Bars
When the vertical color bars mode is selected, a typical color bar pattern will be sent
through the digital pipeline.
Walking 1s
When the walking 1s mode is selected, a walking 1s pattern will be sent through the
digital pipeline. The first value in each row is 1.
AR0130 DS Rev. L Pub. 6/15 EN
31
©Semiconductor Components Industries, LLC, 2015.