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PC87591E Datasheet, PDF (375/437 Pages) National Semiconductor (TI) – LPC Mobile Embedded Controllers
7.0 Device Specifications (Continued)
7.2.4 Input, TTL Compatible
Symbol: INT
Symbol
Parameter
Conditions
Min
Max
Unit
VIH Input High Voltage
2.0
5.51
V
VIL Input Low Voltage
−0.51
0.8
V
IIL2 Input Leakage Current
0 < VIN < VCC
±13
µA
1. Not tested; guaranteed by design.
2. Input leakage current includes the output leakage of the bidirectional buffers with TRI-STATE outputs.
3. Maximum 10 µA for all pins together.
7.2.5 Input, TTL Compatible with Schmitt Trigger
Symbol: INTS
Symbol
Parameter
Conditions
VIH Input High Voltage, 5V tolerant pins1
Input High Voltage, pins without 5V tolerance1
VIL Input Low Voltage
VH Input Hysteresis
IIL Input Leakage Current
0 < VIN < VSUP
1. See Section 7.1.2 on page 372.
2. Not tested; guaranteed by design.
3. VSUP is VDD or VCC, according to the power well of the input.
4. Not tested; guaranteed by characterization.
5. Maximum 10 µA for all pins together.
Min
Max
2.0
5.52
2.0 VSUP3+0.52
−0.52
0.8
2504
±15
Unit
V
V
V
mV
µA
7.2.6 Output, TTL Compatible Push-Pull Buffer
Symbol: Op/n
Output, TTL-compatible, rail-to-rail push-pull buffer that is capable of sourcing p mA and sinking n mA
Symbol
Parameter
VOH Output High Voltage
Conditions
IOH = −p mA
IOH = −50 µA
VOL Output Low Voltage
IOL = n mA
IOL = 50 µA
1. VSUP is VDD or VCC, according to the power well of the input.
Min
Max Unit
2.4
V
VSUP1 −
V
0.2
0.4
V
0.2
V
Revision 1.07
375
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