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80333 Datasheet, PDF (73/75 Pages) Intel Corporation – I/O Processor
4.6
AC Test Conditions
Table 37. AC Measurement Conditions
Symbol
PCI-X
PCI
DDR / DDR-II
DDR-II
PBI
Vth
0.6 VCC33
0.6 VCC33
2.0 / 1.15
1.15
2.0
Vtl
0.25 VCC33
0.2 VCC33
0.5 / 0.2
0.2
0.8
Vtest
0.4 VCC33
0.4 VCC33
1.25 / 0.90
0.90
1.5
Vtrise
0.285 VCC33 0.285 VCC33 1.25 / 0.90
0.90
1.5
Vtfall
0.615 VCC33 0.615 VCC33 1.25 / 0.90
0.90
1.5
Vmax
0.4 VCC33
0.4 VCC33
1.5 / 0.97
0.97
1.2
Slew Rate1
1.5
1.5
1.0
1.0
1.0
Notes:
1.
Input signal slew rate is measured between Vil and Vih.
Figure 14. AC Test Load for All Signals Except PCI and DDR SDRAM
Output
50pF
Test
Point
80333
Units
V
V
V
V
V
V
V/nS
Figure 15. AC Test Load for DDR SDRAM Signals
Output
1.25V
25Ω
25Ω
Test
Point
30pF
Figure 16.
PCI/PCI-X TOV(max) Rising Edge AC Test Load
Test
Point
Output
25Ω
10pF
Datasheet
Intel® 80333 I/O Processor Datasheet
Order Number: 305433, Revision: 002
May 2005
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