TC1724 Datasheet, PDF (75/134 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller

TC1724
Electrical Parameters
Table 23 3.3V ADC Parameters (cont’d)
Parameter
Symbo
Values
Unit
l
Min. Typ. Max.
Note /
Test Condition
ON resistance of the
R_AIN
−
transmission gates in the
C
analog voltage path
C
3500 9000 Ohm
ON resistance for the
ADC test (pull down for
AIN7)
R_AIN7T 180
CC
800 1800
Ohm
Test feature
available only
for odd AINx
pins
Resistance of the
reference voltage input
path
R_AREF −
CC
Broken wire detection
delay against VAGND
Broken wire detection
delay against VAREF
t_BWG
−
CC
t_BWR CC −
1700 3000
− 50
Ohm
13)
500 Ohm
increased if
AIN[1:0] used
as reference
input
− 50
14)
Sample time
t_S CC 2
−
257
T_ADCI
Calibration time after bit t_CAL CC −
ADC_GLOBCFG.SUCAL
is set
− 4352 cycles
Total Unadjusted
Error^5)6)15)
TUE -4.5
−
4.5¹⁶⁾ LSB ADC
CC
resolution= 12-
bit
Analog reference
ground²⁾
V_AGND0 V_SSM - −
SR 0.05
Analog input voltage
V_AIN SR V_AGND0 −
Analog reference
voltage²⁾
V_AREF0
SR
V_AGND0 −
+
V_DDM/2
Analog reference voltage V_AREF0 - V_DDM/2 −
range⁵⁾⁶⁾²⁾
V_AGND0
SR
V_AREF0 V
-
V_DDM/2
V_AREF0 V
V_DDM + V
0.05¹⁷⁾
18)
V_DDM + V
0.05
1) The sampling capacity of the conversion C-network is pre-charged to V_AREF/2 before the sampling moment.
Because of the parasitic elements the voltage measured at AINx can deviate from V_AREF/2.
Data Sheet
5-30
V1.2, 2014-06