TC1724 Datasheet, PDF (125/134 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller

TC1724
Electrical Parameters
Table 42 FLASH32 Parameters (cont’d)
Parameter
Symbol
Values
Unit Note /
Min. Typ. Max.
Test Condition
DFlash wait state WS_DF SR 50ns x −
−
configuration
f_LMB
PFlash wait state WS_PF SR 26ns x −
−
configuration
f_LMB
1) In case of wordline oriented defects (see robust EEPROM emulation in the User's Manual) this erase time can
increase by up to 100%.
2) In case the Program Verify feature detects weak bits, these bits will be programmed up to twice more. Each
reprogramming takes additional 5 ms.
3) In case the Program Verify feature detects weak bits, these bits will be programmed once more. The
reprogramming takes additional 5 ms.
4) Only valid when a robust EEPROM emulation algorithm is used. For more details see the User´s Manual.
5) Storage and inactive time included.
6) At average weighted junction temperature T_j = 100°C, or the retention time at average weighted temperature
of T_j = 110°C is minimum 10 years, or the retention time at average weighted temperature of T_j = 150°C is
minimum 0.7 years.
5.4.4 Quality Declarations
Table 43 Quality Parameters
Parameter
Symbol
Values
Unit Note / Test Condition
Operation
Lifetime¹⁾
Min. Typ. Max.
t_OP
– – 24000 hours –²⁾
ESD susceptibility V_HBM – – 2000 V
according to
Human Body
Model (HBM)
Conforming to
JESD22-A114-B
ESD susceptibility V_CDM – – 500 V
according to
Charged Device
Model (CDM)
Conforming to
JESD22-C101-C
Moisture
MSL – – 3
Sensitivity Level
–
Conforming to Jedec
J-STD-020C for 240°C
1) This lifetime refers only to the time when the device is powered on.
Data Sheet
5-80
V1.2, 2014-06