HY29DL162 Datasheet, PDF (32/48 Pages) Hynix Semiconductor – 16 Megabit (2M x 8/1M x16) Low Voltage, Dual Bank, Simultaneous Read/Write Flash Memory

HY29DL162/HY29DL163
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don't Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Centerline is High Impedance State
(High Z)
TEST CONDITIONS
+ 3.3V
DEVICE
UNDER
TEST
C_L
6.2
KOhm
2.7
KOhm
All diodes
are
1N3064
or
equivalent
Figure 13. Test Setup
Table 17. Test Specifications
Test
Condition
- 70
- 80
- 90
- 12
Unit
Output Load
Figure 13
Output Load Capacitance (C_L) 30 100 pF
Input Rise and Fall Times
5
ns
Input Signal Low Level
0.0
V
Input Signal High Level
3.0
V
Input Timing Measurement
Signal Level
1.5
V
Output Timing Measurement
Signal Level
1.5
V
Note: Timing measurements are made at the reference
levels specified above regardless of where the illustrations
in the timing diagrams appear to indicate the measurement
is made
3.0 V
0.0 V
Input 1.5 V
Measurement Level
1.5 V Output
Figure 14. Input Waveforms and Measurement Levels
32
r1.3/June 01