33888 Datasheet, PDF (8/40 Pages) Freescale Semiconductor, Inc – Quad High-Side and Octal Low-Side Switch for Automotive

ELECTRICAL CONNECTIONS
MAXIMUM RATINGS
ELECTRICAL CONNECTIONS
MAXIMUM RATINGS
Table 4. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
Symbol
Value
Unit
ELECTRICAL RATINGS
Power Supply Voltage
Steady State
Input Pin Voltage ⁽¹⁾
WAKE Input Pin Clamp Current
Continuous per Output Current ⁽²⁾
Low-Sides 4, 6, 8, 10
Low-Sides 5, 7, 9, 11
Continuous per Output Current ⁽³⁾
High-Sides 0, 1
High-Sides 2, 3
V_PWR
V
-16 to 41
V_IN
- 0.3 to 7.0
V
I_WICI
2.5
mA
I_OUTLS
mA
500
800
I_OUTHS
A
10
5.0
Output Clamp Energy
High-Sides 0, 1 ⁽⁴⁾
High-Sides 2, 3 ⁽⁵⁾
Low-Sides ⁽⁶⁾
mJ
E_HS
450
E_HS
120
E_LS
50
ESD Voltage ⁽⁷⁾
Human Body Model
Machine Model
V
V_ESD1
V_ESD2
± 2000
± 200
Notes
1. Exceeding voltage limits on SCLK, SI, CS, WDIN, RST, IHS, FSI, or ILS pins may cause a malfunction or permanent damage to the
device.
2. Continuous low-side output current rating so long as maximum junction temperature is not exceeded. Operation at 125°C ambient
temperature will require calculation of maximum output current using package thermal resistance.
3. Continuous high-side output current rating so long as maximum junction temperature is not exceeded. Operation at 125°C ambient
temperature will require calculation of maximum output current using package thermal resistance.
4. Active HS0 and HS1 clamp energy using the following conditions: single nonrepetitive pulse, V_PWR = 16.0 V, L = 40 mH, T_J = 150°C.
5. Active HS2 and HS3 clamp energy using the following conditions: single nonrepetitive pulse, V_PWR = 16.0 V, L = 10 mH, T_J = 150°C.
6. Active low-side clamp energy using the following conditions: single nonrepetitive pulse, 450 mA, T_J = 150°C.
7. ESD1 testing is performed in accordance with the Human Body Model (C_ZAP =100 pF, R_ZAP = 1500 Ω), ESD2 testing is performed in
accordance with the Machine Model (C_ZAP = 200 pF, R_ZAP = 0 Ω).
33888
8
Analog Integrated Circuit Device Data
Freescale Semiconductor