33888 Datasheet, PDF (15/40 Pages) Freescale Semiconductor, Inc – Quad High-Side and Octal Low-Side Switch for Automotive

ELECTRICAL CONNECTIONS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 6. Dynamic Electrical Characteristics
Characteristics noted under conditions 6.0 V ≤ V_PWR ≤ 27 V, 4.5 V ≤ V_DD ≤ 5.5 V, -40°C ≤ T_J ≤ 150°C unless otherwise noted.
Typical values noted reflect the approximate parameter means at T_A = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
POWER OUTPUT TIMING
High-Side Output Rising Fast Slew Rate ⁽²⁷⁾
6.0 V < V_PWR < 9.0 V
9.0 V < V_PWR < 16 V
16 V < V_PWR < 27 V
SR_{R_FAST}
0.03
–
0.05
0.5
0.1
–
V/µs
0.6
0.8
1.1
High-Side Output Rising Slow Slew Rate ⁽²⁸⁾
6.0 V < V_PWR < 9.0 V
9.0 V < V_PWR < 16 V
16 V < V_PWR < 27 V
SR_{R_SLOW}
0.01
0.01
0.01
–
0.08
–
0.14
0.18
0.2
V/µs
High-Side Output Falling Fast Slew Rate ⁽²⁷⁾
6.0 V < V_PWR < 9.0 V
9.0 V < V_PWR < 16 V
16 V < V_PWR < 27 V
SR_{F_FAST}
V/µs
0.2
–
1.0
0.3
0.8
1.5
0.5
–
2.2
High-Side Output Falling Slow Slew Rate ⁽²⁸⁾
6.0 V < V_PWR < 9.0 V
9.0 V < V_PWR < 16 V
16 V < V_PWR < 27 V
SR_{F_SLOW}
0.05
–
V/µs
0.3
0.08
0.15
0.4
0.08
–
0.5
High-Side Output Turn ON Delay Time ⁽²⁹⁾
High-Side Output Turn OFF Delay Time ⁽³⁰⁾
Low-Side Output Falling Slew Rate ⁽³¹⁾
Low-Side Output Rising Slew Rate ⁽³¹⁾
Low-Side Output Turn ON Delay Time ⁽³²⁾
Low-Side Output Turn OFF Delay Time ⁽³³⁾
Low-Side Output Fault Delay Timer ⁽³⁴⁾
t _DLY(ON)
5.0
30
150
µs
t _DLY(OFF)
5.0
80
150
µs
SR_F
0.5
3.0
10
V/µs
SR_R
1.0
6.0
20
V/µs
t _DLY(ON)
0.5
2.0
10
µs
t _DLY(OFF)
0.5
4.0
10
µs
t _DLY(FS)
70
150
250
µs
Notes
27. High-side output rise and fall fast slew rates measured across a 5.0 Ω resistive load at high-side output = 0.5 V to V_PWR-3.0 V
(see Figure 5, page 17). These parameters are guaranteed by process monitoring.
28. High-side output rise and fall slow slew rates measured across a 5.0 Ω resistive load at high-side output = 0.5 V to V_PWR-3.0 V
(see Figure 5, page 17). These parameters are guaranteed by process monitoring.
29. High-side output turn-ON delay time measured from 50% of the rising IHS to 0.5 V of output OFF with R_L = 27 Ω resistive load
(see Figure 5, page 17).
30. High-side output turn-OFF delay time measured from 50% of the falling IHS to V_PWR-2.0 V of the output OFF with R_L = 27 Ω resistive
load (see Figure 5, page 17).
31. Low-side output rise and fall slew rates measured across a 5.0 Ω resistive load at low-side output = 10% to 90% (see Figure 6, page 17).
32. Low-side output turn-ON delay time measured from 50% of the rising ILS to 90% of V_OUT with R_L = 27 Ω resistive load (see Figure 6,
page 17).
33. Low-side output turn-OFF delay time measured from 50% of the falling ILS to 10% of V_OUT with R_L = 27 Ω resistive load (see Figure 6,
page 17). These parameters are guaranteed by process monitoring.
34. Propagation time of Short Fault Disable Report Delay measured from rising edge of CS to output disabled, low-side = 5.0 V, and device
configured for low-side output overcurrent latch-off using CLOCCR.
Analog Integrated Circuit Device Data
Freescale Semiconductor
33888
15