33888 Datasheet, PDF (12/40 Pages) Freescale Semiconductor, Inc – Quad High-Side and Octal Low-Side Switch for Automotive

ELECTRICAL CONNECTIONS
STATIC ELECTRICAL CHARACTERISTICS
Table 5. Static Electrical Characteristics (continued)
Characteristics noted under conditions 6.0 V ≤ V_PWR ≤ 27 V, 4.5 V ≤ V_DD ≤ 5.5 V, -40°C ≤ T_J ≤ 150°C unless otherwise noted.
Typical values noted reflect the approximate parameter means at T_A = 25°C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
HS0 AND HS1 POWER OUTPUTS (continued)
Output Fault Detection Threshold ⁽¹⁴⁾
Output Programmed OFF
V_OFD(THRES)
V
2.0
3.0
4.0
Output Negative Clamp Voltage
0.5 A < I_OUT < 2.0 A, Output OFF
Overtemperature Shutdown (Outputs OFF) ⁽¹⁵⁾
Overtemperature Shutdown Hysteresis ⁽¹⁵⁾
HS2 AND HS3 POWER OUTPUTS
V_CL
V
- 20
–
–
T_SD
160
175
190
°C
T_SD(HYS)
10
–
30
°C
Drain-to-Source ON Resistance (I_OUT = 4.5 A)
T_J = 25°C
V_PWR = 6.0 V
V_PWR = 9.0 V
V_PWR = 13 V
T_J = 150°C
V_PWR = 6.0 V
V_PWR = 9.0 V
V_PWR = 13 V
R_DS(ON)
–
–
–
–
–
–
Ω
–
0.08
–
0.04
–
0.04
–
0.136
–
0.068
–
0.068
Reverse Battery Source-to-Drain ON Resistance (I_OUT = 4.5 A, T_J = 25°C) _RDS(ON)REV
V_PWR = -12 V
–
Ω
–
0.08
Output Self-Limiting Peak Current
Outputs ON, V_OUT = V_PWR -2.0 V
I_LIM(PK)
A
15
23
35
Output Self-Limiting Sustain Current
Outputs ON, V_OUT = V_PWR -2.0 V
Open Load Detection Current ⁽¹⁶⁾
Output Fault Detection Threshold ⁽¹⁷⁾
Outputs Programmed OFF
I_LIM(SUS)
A
6.0
10
15
I_OLDC
25
–
100
µA
V_OFD(THRES)
V
2.0
3.0
4.0
Output Negative Clamp Voltage
0.5 A < I_OUT < 2.0 A, Outputs OFF
V_CL
V
- 20
–
–
Overtemperature Shutdown (Outputs OFF) ⁽¹⁸⁾
Overtemperature Shutdown Hysteresis ⁽¹⁸⁾
T_SD
160
170
190
°C
T_SD(HYS)
10
–
30
°C
Notes
14. Output fault detection threshold with outputs programmed OFF. For the Low-Side Outputs, fault detection thresholds are the same for
output open and battery shorts.
15. Guaranteed by design. Not production tested.
16. Output OFF Open Load Detection Current is the current required to flow through the load for the purpose of detecting the existence of
an open load condition when the specific output is commanded OFF.
17. Output fault detection threshold with outputs programmed OFF.
18. Guaranteed by design. Not production tested.
33888
12
Analog Integrated Circuit Device Data
Freescale Semiconductor