33888 Datasheet, PDF (30/40 Pages) Freescale Semiconductor, Inc – Quad High-Side and Octal Low-Side Switch for Automotive

TYPICAL APPLICATIONS
Table 12. Rating of Fast Transient Pulses on VPWR
Test Pulse
Test Level
Rate
Nb of pulses or test time
Comment
1
-100V
D
5000 for each config
1
-40V
2A
+50V
A
5000 for each config
D
5000 for each config
2A
+42V
3A
-150V
3B
+100V
5A
+42V
A
5000 for each config
A
1h for each config
A
1h for each config
A
50 for each config
5B
+42v Clamped
A
50 for each config
Rate signification:
A: Device fully operational after test without any degradation.
B: One or more function is (are) unavailable during the test and good after
C: One or more function is (are) unavailable during the test and after it.
D: Device’s damaged.
Failure in case of openload
condition
/
Failure in case of openload
condition for high-side ‘on’
/
/
/
When outputs are on, the
load dump reset it
When outputs are on, the
load dump reset it
Pulse on one output while others are open:
Table 13. Results of Fast Transient Pulses on HS1 and HS3
Pulse on high-side output
HS1
Pulse 1 Ri = 10Ω, 5000 occurrences
PASS: -100 V
HS3
PASS: -100 V
Table 14. Results of Fast Transient Pulses on LS4 and LS5
Pulse on low-side output
LS4
Pulse 2a Ri = 2Ω, 5000 occurrences
PASS: +50 V
LS5
PASS: +50 V
Table 15. Rating of Fast Transient Pulses on HS1, HS3, LS4, and LS5
Test pulse
Test Level
Rate
Nb of pulses or test time
1
-100V
A
2A
+50V
A
Rate signification:
A: Device fully operational after test without any degradation.
B: One or more function is (are) unavailable during the test and good after
C: One or more function is (are) unavailable during the test and after it.
D: Device’s damaged.
5000 for each config
5000 for each config
Comment
/
/
33888
30
Analog Integrated Circuit Device Data
Freescale Semiconductor