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XPC8260ZUIFBC Datasheet, PDF (12/50 Pages) Freescale Semiconductor, Inc – PowerQUICC II Integrated Communications Processor Hardware Specifications
Electrical and Thermal Characteristics
2 The leakage current is measured for nominal VDD, VCCSYN, and VDD.
3 MPC8265 and MPC8266 only.
2.2 Thermal Characteristics
Table 4 describes thermal characteristics.
Table 4. Thermal Characteristics for 480 TBGA Package
Characteristics
Symbol
Value
Unit
Air Flow
Junction to ambient
131
NC2
θJA
101
°C/W
1 m/s
113
NC
83
1 m/s
Junction to board4
θJB
4
°C/W
—
Junction to case5
θJC
1.1
°C/W
—
1 Assumes a single layer board with no thermal vias
2 Natural convection
3 Assumes a four layer board
4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is
measured on the top surface of the board near the package.
5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL
SPEC-883 Method 1012.1).
2.3 Power Considerations
The average chip-junction temperature, TJ, in °C can be obtained from the following:
TJ = TA + (PD x θJA)
(1)
where
TA = ambient temperature °C
θJA = package thermal resistance, junction to ambient, °C/W
PD = PINT + PI/O
PINT = IDD x VDD Watts (chip internal power)
PI/O = power dissipation on input and output pins (determined by user)
For most applications PI/O < 0.3 x PINT. If PI/O is neglected, an approximate relationship between PD and
TJ is the following:
PD = K/(TJ + 273° C)
(2)
Solving equations (1) and (2) for K gives:
K = PD x (TA + 273° C) + θJA x PD2
(3)
MPC8260A PowerQUICC™ II Integrated Communications Processor Hardware Specifications, Rev. 2.0
12
Freescale Semiconductor