NT5DS64M4AT Datasheet, PDF (62/78 Pages) List of Unclassifed Manufacturers – 256Mb Double Data Rate SDRAM

NT5DS64M4AT NT5DS64M4AW
NT5DS32M8AT NT5DS32M8AW
256Mb Double Data Rate SDRAM
14. An input setup and hold time derating table is used to increase t IS and t IH in the case where the input slew
rate is below 0.5 V/ns.
Input Slew Rate
delta ( t IS)
delta ( t IH)
Unit
Notes
0.5 V/ns
0
0.4 V/ns
+50
0
ps
1,2
0
ps
1,2
0.3 V/ns
+100
0
ps
1,2
1. Input slew rate is based on the lesser of the slew rates determined by either V IH (AC) to V IL (AC) or V IH (DC) to V IL (DC) , similarly for rising
transitions.
2. These derating parameters may be guaranteed by design or tester characterization and are not necessarily tested on eachdevice.
15. An input setup and hold time derating table is used to increase t DS and t DH in the case where the I/O slew rate is below
0.5 V/ns.
Input Slew Rate
delta ( t DS)
delta ( t DH)
Unit
Notes
0.5 V/ns
0
0
ps
1,2
0.4 V/ns
+75
+75
ps
1,2
0.3 V/ns
+150
+150
ps
1,2
1. I/O slew rate is based on the lesser of the slew rates determined by either V IH (AC) to V IL (AC) or V IH (DC) to V IL (DC) , similarly for rising
transitions.
2. These derating parameters may be guaranteed by design or tester characterization and are not necessarily tested on eachdevice.
16. An I/O Delta Rise, Fall Derating table is used to increase t DS and t DH) in the case where DQ, DM, and DQS slew rates
differ.
Input Slew Rate
delta ( t DS)
delta ( t DH)
Unit
Notes
0.0 V/ns
0
0
ps
1,2,3,4
0.25 V/ns
0.5 V/ns
+50
+100
+50
+100
ps
1,2,3,4
ps
1,2,3,4
1. Input slew rate is based on the lesser of the slew rates determined by either V IH (AC) to V IL (AC) or V IH (DC) to V IL (DC) , similarly for rising
transitions.
2. Input slew rate is based on the larger of AC to AC delta rise, fall rate and DC to DC delta rise, fall rate.
3. The delta rise, fall rate is calculated as: [1/(slew rate 1)] - [1/(slew rate 2)]
For example: slew rate 1 = 0.5 V/ns; slew rate 2 = 0.4 V/ns
Delta rise, fall = (1/0.5) - (1/0.4) [ns/V]
= -0.5 ns/V
Using the table above, this would result in an increase in t DS and t DH of 100 ps.
4. These derating parameters may be guaranteed by design or tester characterization and are not necessarily tested on each device.
REV 1.1
12/2001
62
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