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NT5DS64M4AT Datasheet, PDF (57/78 Pages) List of Unclassifed Manufacturers – 256Mb Double Data Rate SDRAM
NT5DS64M4AT NT5DS64M4AW
NT5DS32M8AT NT5DS32M8AW
256Mb Double Data Rate SDRAM
AC Input Operating Conditions (0 °C ≤ TA ≤ 70 °C; VDDQ = 2.5V ± 0.2V; VDD = 2.5V ± 0.2V, See AC
Characteristics)
Symbol
VIH(AC)
VIL(AC)
VID(AC)
VIX(AC)
Parameter/Condition
Input High (Logic 1) Voltage, DQ, DQS, and DM Signals
Input Low (Logic 0) Voltage, DQ, DQS, and DM Signals
Input Differential Voltage, CK and CK Inputs
Input Crossing Point Voltage, CK and CK Inputs
Min
Max
Unit
VREF + 0.31
V
VREF − 0.31
V
0.62
VDDQ + 0.6
V
0.5*VDDQ − 0.2 0.5*VDDQ + 0.2 V
Notes
1, 2
1, 2
1, 2, 3
1, 2, 4
1. Input slew rate = 1V/ns.
2. Inputs are not recognized as valid until VREF stabilizes.
3. VID is the magnitude of the difference between the input level on CK and the input level on CK.
4. The value of VIX is expected to equal 0.5*VDDQ of the transmitting device and must track variations in the DC level of the same.
IDD Specifications and Conditions (0 °C ≤ TA ≤ 70 °C; VDDQ = 2.5V ± 0.2V; VDD = 2.5V ± 0.2V, See AC
Characteristics)
Symbol
Parameter/Condition
IDD0
IDD1
IDD2P
IDD2N
IDD3P
IDD3N
IDD4R
IDD4W
IDD5
IDD6
IDD7
Operating Current: one bank; active / precharge; tRC = tRC (min); DQ, DM, and
DQS inputs changing twice per clock cycle; address and control inputs changing
once per clock cycle
Operating Current: one bank; active / read / precharge; Burst = 2; tRC = tRC
(min); CL = 2.5; IOUT = 0mA; address and control inputs changing once per clock
cycle
Precharge Power-Down Standby Current: all banks idle; power-down mode;
CKE ≤ VIL (max)
Idle Standby Current: CS ≥ VIH (min); all banks idle; CKE ≥ VIH (min);
address and control inputs changing once per clock cycle
Active Power-Down Standby Current: one bank active; power-down mode;
CKE ≤ VIL (max)
Active Standby Current: one bank; active / precharge; CS ≥ VIH (min);
CKE ≥ VIH (min); tRC = tRAS (max); DQ, DM, and DQS inputs changing twice per
clock cycle; address and control inputs changing once per clock cycle
Operating Current: one bank; Burst = 2; reads; continuous burst; address and
control inputs changing once per clock cycle; DQ and DQS outputs changing
twice per clock cycle; CL = 2.5; IOUT = 0mA
Operating Current: one bank; Burst = 2; writes; continuous burst; address and
control inputs changing once per clock cycle; DQ and DQS inputs changing twice
per clock cycle; CL = 2.5
Auto-Refresh Current: tRC = tRFC (min)
Self-Refresh Current: CKE ≤ 0.2V
Operating current: four bank; four bank interleaving with BL = 4, address and
control inputs randomly changing; 50% of data changing at every transfer;
t RC = t RC (min); I OUT = 0mA.
DDR200
(8B)
tCK=10ns
75
90
15
30
15
50
130
115
160
2
TBD
DDR266A/B
(7K/75B)
tCK=7.5ns
Unit Notes
85
mA 1
110
mA 1
15
mA 1
35
mA 1
15
mA 1
60
mA 1
165
mA 1
150
170
2
TBD
mA 1
mA 1
mA 1, 2
mA 1
1. IDD specifications are tested after the device is properly initialized.
2. Enables on-chip refresh and address counters.
REV 1.1
12/2001
57
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NANYA TECHNOLOGY CORP. reserves the right to change Products and Specifications without notice.