LM3S8971 Datasheet, PDF (48/577 Pages) List of Unclassifed Manufacturers – Microcontroller

JTAG Interface
5 JTAG Interface
The Joint Test Action Group (JTAG) port is an IEEE standard that defines a Test Access Port and
Boundary Scan Architecture for digital integrated circuits and provides a standardized serial interface
for controlling the associated test logic. The TAP, Instruction Register (IR), and Data Registers (DR)
can be used to test the interconnections of assembled printed circuit boards and obtain manufacturing
information on the components. The JTAG Port also provides a means of accessing and controlling
design-for-test features such as I/O pin observation and control, scan testing, and debugging.
The JTAG port is comprised of the standard five pins: TRST, TCK, TMS, TDI, and TDO. Data is
transmitted serially into the controller on TDI and out of the controller on TDO. The interpretation of
this data is dependent on the current state of the TAP controller. For detailed information on the
operation of the JTAG port and TAP controller, please refer to the IEEE Standard 1149.1-Test
Access Port and Boundary-Scan Architecture.
The Luminary Micro JTAG controller works with the ARM JTAG controller built into the Cortex-M3
core. This is implemented by multiplexing the TDO outputs from both JTAG controllers. ARM JTAG
instructions select the ARM TDO output while Luminary Micro JTAG instructions select the Luminary
Micro TDO outputs. The multiplexer is controlled by the Luminary Micro JTAG controller, which has
comprehensive programming for the ARM, Luminary Micro, and unimplemented JTAG instructions.
The JTAG module has the following features:
■ IEEE 1149.1-1990 compatible Test Access Port (TAP) controller
■ Four-bit Instruction Register (IR) chain for storing JTAG instructions
■ IEEE standard instructions:
– BYPASS instruction
– IDCODE instruction
– SAMPLE/PRELOAD instruction
– EXTEST instruction
– INTEST instruction
■ ARM additional instructions:
– APACC instruction
– DPACC instruction
– ABORT instruction
■ Integrated ARM Serial Wire Debug (SWD)
See the ARM® Cortex™-M3 Technical Reference Manual for more information on the ARM JTAG
controller.
48
October 01, 2007
Preliminary