ISD-T360SB Datasheet, PDF (101/109 Pages) List of Unclassifed Manufacturers – VoiceDSP Digital Speech Processor with Master/Slave, Full-Duplex Speakerphone, Multiple Flash and ARAM/DRAM Support

2—SOFTWARE
ISD-T360SB
Table 2-10: TUNABLE PARAMETERS: Memory Support
Index
Parameter Name
Description
62
Memory Device Size: Defines the nubber of blocks (each block is of 4096 bytes) in
NUM_OF_BLOCKS_IN_M every memory device (Flash or ARAM/DRAM). The number
EM
and type of connected devices are defined by the CFG
command.
Default
128
Flash Device Size (Mbits) Number of Blocks Value
4
128
8
256
16
512
ARAM/DRAM Device Size (Mbits) Number of Blocks Value
16
508
63
Memory Size for Testing Defines the nubber of blocks (each block is of 4096 bytes) in 0
NUM_OF_BLOCKS_FOR_ every memory device (Flash or ARAM/DRAM) for production
TEST
line testing purposes.
The number should be small to minimize testing time during
the production sequence. However, the number of blocks
should be larger than the number of expected bad blocks in
the memory device.
In case of value=0, no productiontest is performed.
In any case other than value= 0, the number of blocks is
defined by the parameter value, and a production testing
cycle is performed after RESET.
Legal values: 0 to 128.
Note: If power fails during production testing cycle, the
memory status is unpredicted. The memory device should be
replaced and the production test should be repeated.
64
ARAM Quality Level: Defines the maximum allowed bad nibbles in ARAM block
0
MAX_DEFECT_NIBBLES_I (each block is of 8192 nibbles). A nibble (4 bits) is considered
N_BLOCK
bad if any bit is defected.
If the number of bad nibbles in a block exceeds the maximum
allowed value, the block is marked as bad block and is not
used for voice storage.
Legal values: 0 to 255.
ISD
2-61