TA1317AFG Datasheet, PDF (46/58 Pages) Toshiba Semiconductor – Deflection Processor IC for TV

Note
No.
Parameter
30 Horizontal DF bathtub
(H DF curve) adjustment
TA1317AFG
SW6
OFF
SW7
B
SW8
ON
Test Condition
SW Mode
SW10 SW13 SW14 SW21 SW30
Test Method
(unless otherwise specified, V_CC = 9 V, Ta = 25 ± 3°C, data = preset values)
OFF B
ON
A
A (1) Input horizontal trigger pulse (figure below) to pin 15 (FBP IN).
Pulse level (HT) = 4.0 V
(2) Set H-DF AMPLITUDE (sub-address: 07) to maximum (data: 8F).
(3) Set H-DF CURVE (sub-address: 08) to minimum (data: 00) and measure pin 20
(H-DF OUT) phase T_HB (00).
(4) Set H-DF CURVE (sub-address: 08) to maximum (data: F0) and measure pin 20
(H-DF OUT) phase T_HB (F0).
(5) Calculate change amount T_HB using the following formula.
1V
T_HB (F0)
T_HB (00)
Pin 20 (H-DF OUT) waveform
T_HB (00) − T_HB (F0)
T_HB =
2
46
2005-08-18