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TA1317AFG Datasheet, PDF (42/58 Pages) Toshiba Semiconductor – Deflection Processor IC for TV
Note
No.
Parameter
24 Parabola amplitude EHT
compensation
25 AGC operating current
TA1317AFG
SW6
OFF
OFF
SW7
B
B
SW8
ON
Test Condition
SW Mode
SW10 SW13 SW14 SW21 SW30
Test Method
(unless otherwise specified, VCC = 9 V, Ta = 25 ± 3°C, data = preset values)
OFF B
ON
A
A (1) Input vertical trigger pulse to pin VIN.
Pulse level (VT) = 3.0 V
(2) Apply external power supply V3 to pin 3 (EHT IN).
(3) Set EW PARABOLA (sub-address: 0A) to center (data: 20).
(4) Set external power supply V3 to 7 V and measure Pin 13 (EW FD) amplitude EHT
(7).
(5) Set external power supply V3 to 1 V and measure Pin 13 (EW FD) amplitude EHT
(1).
(6) Calculate change amount EHT using the following formula.
EHT (7) − EHT (1)
EHT =
× 100
EHT (7)
ON OFF B
ON
A
B (1) Input vertical trigger pulse to pin VIN.
Pulse level (VT) = 3.0 V
(2) When V AGC (sub-address: 09) is switched, set data to 00, 40, 80, and C0 and
measure the following.
(3) Connect GND through 200 Ω to pin 30 (AGC FILTER).
(4) Monitor pin 30 (AGC FILTER) and measure pulse levels VX (00), VX (40), VX (80),
and VX (C0) as shown in the figure below.
(5) Calculate output currents (IX (00), IX (40), IX (80), IX (C0) using the following
formula.
VX
Pin 30 (AGC FILTER) waveform
VX (**)
IX (**) =
200 Ω
42
2005-08-18