TA1318N Datasheet, PDF (35/41 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Note
Item
VA04 Vertical free-run frequency
TA1318N
SW Mode
S06 S18 S19 S21
Test Conditions and Measuring Method (V_CC = 9 V, Ta = 25 ± 3 C, unless otherwise specified)
c
b

 (1) Input Signal a (horizontal 33.75 kHz) to pin 11 (HD3-IN).
(2) Set sub-address (00) B0.
(3) When sub-address (02) is 02, 22, 62, 82, A2 or C2, measure the frequency FV0, FV1, FV3, FV4, FV5 or FV6
of pin 22 (VD1-OUT) wave form.
(4) Input no-signal to pin 3 (HD1-IN).
(5) Set sub-address (02) 42.
(6) When sub-address (00) is 30, 70, B0 or F0, measure the frequency FV20, FV21, FV22 or FV23 of pin 22
(VD1-OUT) wave form.
Signal a
Pin 22 wave form
29.63 µs
0.593 µs
0.285 V
V period
VPW*
35
2003-02-19