TA1318N Datasheet, PDF (32/41 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1318N
Note
Item
HB03 HD output pulse width
(free-run)
SW Mode
S06 S18 S19 S21
Test Conditions and Measuring Method (V_CC = 9 V, Ta = 25 ± 3 C, unless otherwise specified)
c
b

 (1) BUS control data preset.
(2) When horizontal oscillation frequency is 15.75 kHz (00), measure the output pulse width TH00 of pin 13
(HD1-OUT) wave form.
(3) When horizontal oscillation frequency is 31.5 kHz (01), 33.75 kHz (10), 45 kHz (11), measure the output
pulse width TH01, TH02, TH03 as well.
Pin 13 (HD1OUT)
wave form
TH
HB04 Horizontal free-run frequency
OPEN b
HB05 Horizontal oscillation control sensitivity OPEN b

 (1) BUS control data preset.
(2) SW6 open. When horizontal oscillation frequency is 15.75 kHz (00), measure the oscillation frequency F00 of
pin 13 (HD1-OUT) wave form.
(3) When horizontal oscillation frequency is 31.5 kHz (01), 33.75 kHz (10), 45 kHz (11), measure the oscillation
frequency F01, F10, F11 as well.
(4) When horizontal oscillation frequency is 15.75 kHz (00) and vertical free-run frequency is (101), measure the
oscillation frequency F50 of pin 15 wave form.

 (1) BUS control data preset.
(2) SW6 open.
(3) Connect external voltage with pin 6 . Horizontal oscillation frequency is 15.75 kHz (00). Supply V6 (about 6.3
V) + 0.05 V or V6 − 0.05 V to pin 6, then measure the frequency FA, FB of pin 13 (HD1-OUT) wave form.
Calculate frequency changing ratio (BH00). BH00 = (FB − FA)/0.1
(4) When horizontal oscillation frequency is 31.5 kHz (01), 33.75 kHz (10), 45 kHz (11), calculate BH01, BH10,
BH11 as wall.
32
2003-02-19