TA1318N Datasheet, PDF (34/41 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Note
Item
VA03 Vertical output pulse width
TA1318N
SW Mode
S06 S18 S19 S21
Test Conditions and Measuring Method (V_CC = 9 V, Ta = 25 ± 3 C, unless otherwise specified)
c
b

 (1) Input Signal a (horizontal 33.75 kHz) to pin 11 (HD3-IN).
(2) Set sub-address (02) 02.
(3) When sub-addrss (00) is B0, measure the pulse width VPW2 of pin 22 (VD1-OUT) wave form.
(4) When sub-addrss (00) is 30, 70, F0, measure the pulse width VPW0, VPW1, VPW3 of pin 22 (VD1-OUT)
wave form as well.
Signal a
Pin 22 wave form
29.63 µs
0.593 µs
V period
VPW*
34
2003-02-19