TA1318N Datasheet, PDF (30/41 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Note
Item
HA09 Delayed HD pulse width
TA1318N
SW Mode
S06 S18 S19 S21
Test Conditions and Measuring Method (V_CC = 9 V, Ta = 25 ± 3 C, unless otherwise specified)
c
b

 (1) Set sub-address (00) 70.
(2) Input Signal b (horizontal 31.5 kHz) to pin 11 (HD3-IN).
(3) Set sub-address (02) 62.
(4) Measure the pulse width (WdHD) of pin 6 (AFC filter) wave form.
Signal b
Pin 6 wave form
31.75 µs
2.35 µs
1.5 V
Wd-HD
30
2003-02-19