TA1318N Datasheet, PDF (27/41 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Note
Item
HA06
HD1 input threshold voltage
HD2 input threshold voltage
HD3 input threshold voltage
(SW block)
TA1318N
SW Mode
S06 S18 S19 S21
Test Conditions and Measuring Method (V_CC = 9 V, Ta = 25 ± 3 C, unless otherwise specified)
c
b

 (1) Set sub-address (00) 40.
(2) Input Signal b (31.5 kHz) to pin 3 (HD1-IN).
(3) Increasing the voltage of Signal b from 0 V, measure the voltage of Signal b V_thHD1 when HD1-OUT lock.
(4) Measure the voltage of pin 1 V_thHD2. Measure the voltage of pin 11 V_thHD3 as well.
Signal b
31.75 µs
2.35 µs
V_thHD1
27
2003-02-19