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TC94A04AFG Datasheet, PDF (33/42 Pages) Toshiba Semiconductor – 1 chip Audio Digital Processor
TC94A04AFG/AFDG
AC Characteristics
AD Converter: LIN1 to LIN4, RIN1 to RIN4 Pins
Characteristics
Maximum input signal level
Input impedance
S/(N + D) ratio
THD + N
Cross-talk
Dynamic range
Symbol
Vin
Zin
S/Na1
S/Na2
THDa
CTa
DRa
Test
Circuit
Test Condition
Min
Input level that ADC output at
⎯ full-scale digital output
1.27
(Note 15)
⎯
Each of LIN1 to LIN4, RIN1 to
RIN4 pins
⎯
⎯
A-Weight,
X’tal: 36.864 MHz
(Note 15)
87
⎯
CCIR-ARM,
X’tal: 36.864 MHz
(Note 15)
83
⎯
20 kHz LPF,
X’tal: 36.864 MHz
(Note 15)
⎯
20 kHz LPF,
⎯ Lch → Rch/Rch → Lch,
⎯
X’tal: 36.864 MHz (Note 15)
⎯
A-Weight,
X’tal: 36.864 MHz
(Note 15)
83
Typ.
1.33
19
95
91
−82
−80
90
Max Unit
⎯ Vrms
⎯
kΩ
⎯
dB
⎯
dB
−70 dB
−72 dB
⎯
dB
Note 15: One input pin selected of four selector of each channels.
Selector Output: OUTL, OUTR Pins
Characteristics
Output signal level
Output impedance
S/(N + D) ratio
THD + N
Cross-talk
Symbol
Test
Circuit
Test Condition
Min Typ. Max Unit
Vout
⎯
1 kHz, 1.122 Vrms input
(Note 15)
0.9
1.0 1.12 Vrms
Zout
S/Ns
THDs
CTs
⎯ OUTL/OUTR pins
⎯ A-Weight
⎯ 20 kHz LPF
⎯
OUTL → OUTR/
OUTR → OUTL
⎯
0.5
⎯
kΩ
93 104 ⎯
dB
⎯ −94 −80 dB
⎯ −88 −80 dB
Note 15: One input pin selected of four selectors of each channels.
DA Converter
Characteristics
Output signal level
S/N ratio
THD + N
Cross-talk
Dynamic range
Symbol
Ao
S/Nd
THDd
CTd
DRd
Test
Circuit
Test Condition
⎯
Output voltage at full-scale
digital input
⎯
A-Weight,
X’tal: 36.864 MHz
⎯
20 kHz LPF,
X’tal: 36.864 MHz
⎯
20 kHz LPF,
X’tal: 36.864 MHz
⎯
A-Weight,
X’tal: 36.864 MHz
Min Typ. Max Unit
1.22 1.27 1.37 Vrms
90
98
⎯
dB
⎯ −86 −75 dB
⎯ −95 −83 dB
87
95
⎯
dB
33
2005-09-28