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LMH0031 Datasheet, PDF (26/39 Pages) National Semiconductor (TI) – SMPTE 292M/259M Digital Video Deserializer Descrambler with Video and Ancillary Data FIFOs
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LMH0031
SNLS218A – JANUARY 2006 – REVISED APRIL 2013
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TEST 0 REGISTER (Address 0Dh)
The Test Pattern Select bits determine which test pattern is output when the Test Pattern Generator (TPG)
mode or the Built-in Self-Test (BIST) mode is enabled. Table 5 gives the codes corresponding to the various test
patterns. All HD colour bar test patterns are inherently BIST data. BIST test patterns for SD are: NTSC, 27MHz,
4x3 Colour Bars and PAL, 27MHz, 4x3 PLL Pathological.
The TPG Enable bit when set to a logic-1 enables the Test Pattern Generator function and built-in self-test
(BIST).
The Pass/Fail bit indicates the result of the built-in self-test. This bit is a logic-1 for a pass condition.
Table 5. Test Pattern Selection Codes(1)
Test Pattern Select Word Bits >
Bit 5
Bit 4
Video Raster Standard
1=HD
0=SD
1=Progressive
0=Interlaced
1=PAL
0=NTSC
1125 Line, 74.25 MHz, 30 Frame Interlaced Component (SMPTE 260M)
Ref. Black
1
0
PLL Path.
1
0
EQ Path.
1
0
Colour Bars
1
0
1125 Line, 74.25 MHz, 30 Frame Interlaced Component (SMPTE 274M)
Ref. Black
1
0
PLL Path.
1
0
EQ Path.
1
0
Colour Bars
1
0
1125 Line, 74.25 MHz, 25 Frame Interlaced Component (SMPTE 274M)
Ref. Black
1
0
PLL Path.
1
0
EQ Path.
1
0
Colour Bars
1
0
1125 Line, 74.25 MHz, 25 Frame Interlaced Component (SMPTE 295M)
Ref. Black
1
0
PLL Path.
1
0
EQ Path.
1
0
Colour Bars
1
0
1125 Line, 74.25 MHz, 30 Frame Progressive Component (SMPTE 274M)
Ref. Black
1
1
PLL Path.
1
1
EQ Path.
1
1
Colour Bars
1
1
1125 Line, 74.25 MHz, 25 Frame Progressive Component (SMPTE 274M)
Ref. Black
1
1
PLL Path.
1
1
EQ Path.
1
1
Colour Bars
1
1
1125 Line, 74.25 MHz, 24 Frame Progressive Component (SMPTE 274M)
Ref. Black
1
1
PLL Path.
1
1
EQ Path.
1
1
Bit 3
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
1
1
1
Bit 2
Bit 1
00=Black
01=PLL Path.
10=EQ Path.
11=Colour Bars
Bit 0
0
0
0
0
0
1
0
1
0
0
1
1
1
0
0
1
0
1
1
1
0
1
1
1
0
0
0
0
0
1
0
1
0
0
1
1
1
0
0
1
0
1
1
1
0
1
1
1
0
0
0
0
0
1
0
1
0
0
1
1
1
0
0
1
0
1
1
1
0
1
1
1
0
0
0
0
0
1
0
1
0
(1) Note: BIST test patterns for SD are: NTSC 4x3 Colour Bars and PAL 4x3 PLL Pathological.
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