LMG5200_15 Datasheet, PDF (6/23 Pages) Texas Instruments – GaN TECHNOLOGY PREVIEWLMG5200 80-V, GaN Half-Bridge Power Stage

LMG5200
SNOSCY4A – MARCH 2015 – REVISED MARCH 2015
Electrical Characteristics (continued)
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
DYNAMIC CHARACTERISTICS
t_HIPLH
t_HIPHL
t_LPLH
t_LPHL
t_MON
Propagation delay⁽¹⁾
Delay matching: LI high and HI low
(2)
HI turning from low to high and SW
node being pulled to VIN (LO is
low), V_VIN = 50 V, V_VCC = 5 V
HI turning from high to low and SW
node being tristated (LO is low),
V_VIN = 50 V, V_VCC = 5 V
LI turning from low to high and
switch node being pulled to PGND
(HI is low), V_VIN = 50 V, V_VCC = 5 V
LI turning from high to low and
switch node being tristated (HI is
low), V_VIN = 50 V, V_VCC = 5 V
V_VIN = 50 V, V_VCC = 5 V
t_MOFF
t_PW
Delay matching: LI low and HI
high ⁽²⁾
Minimum input pulse width that
changes the output
V_VIN = 50 V, V_VCC = 5 V
(1) See Propagation Delay and Mismatch Measurement section.
(2) See Figure 6 through Figure 9.
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MIN
TYP
MAX UNIT
29.5
29.5
29.5
29.5
2
2
10
47
ns
47
ns
47
ns
47
ns
8.0
ns
8.0
ns
ns
6
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