DAC8718 Datasheet, PDF (2/60 Pages) Texas Instruments – Octal, 16-Bit, Low-Power, High-Voltage Output, Serial Input DIGITAL-TO-ANALOG CONVERTER

DAC8718
SBAS467A – MAY 2009 – REVISED DECEMBER 2009
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PRODUCT
DAC8718
RELATIVE
ACCURACY
(LSB)
±4
±4
ORDERING INFORMATION⁽¹⁾
DIFFERENTIAL
LINEARITY
(LSB)
PACKAGE-
LEAD
PACKAGE
DESIGNATOR
±1
QFN-48
RGZ
±1
TQFP-64
PAG
SPECIFIED
TEMPERATURE
RANGE
–40°C to +105°C
–40°C to +105°C
PACKAGE
MARKING
DAC8718
DAC8718
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range (unless otherwise noted).
AV_DD to AV_SS
AV_DD to AGND
AV_SS to AGND, DGND
DV_DD to DGND
IOV_DD to DGND
AGND-x to DGND
Digital input voltage to DGND
SDO to DGND
V_OUT-x, V_MON, AIN-x to AV_SS
REF-A, REF-B to AGND
GPIO-n to DGND
GPIO-n input current
Maximum current from V_MON
Operating temperature range
Storage temperature range
Maximum junction temperature (T_J max)
Human body model (HBM)
ESD ratings
Charged device model (CDM)
Machine model (MM)
Thermal impedance
Junction-to-ambient, θ_JA
Junction-to-case, θ_JC
TQFP
QFN
TQFP
QFN
Power dissipation
DAC8718
–0.3 to 38
–0.3 to 38
–19 to 0.3
–0.3 to 6
–0.3 to min of (6 or DV_DD + 0.3)
–0.3 to 0.3
–0.3 to IOV_DD + 0.3
–0.3 to IOV_DD + 0.3
–0.3 to AV_DD + 0.3
–0.3 to DV_DD
–0.3 to IOV_DD + 0.3
5
3
–40 to +105
–65 to +150
+150
2.5
1000
200
55
27.5
21
10.8
(T_J max – T_A) / θ_JA
UNIT
V
V
V
V
V
V
V
V
V
V
V
mA
mA
°C
°C
°C
kV
V
V
°C/W
°C/W
°C/W
°C/W
W
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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