S1003 Datasheet, PDF (12/42 Pages) Seiko Instruments Inc – MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING)

MANUAL RESET BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) HIGH-ACCURACY VOLTAGE DETECTOR
S-1003 Series
Rev.1.0_00
2. CMOS output product
Table 11
(Ta = +25°C unless otherwise specified)
Item
Symbol
Condition
Test
Min.
Typ.
Max.
Unit _Circuit
Detection voltage^*1 −V_DET
1.2 V ≤ −V_DET < 2.2 V
2.2 V ≤ −V_DET ≤ 5.0 V
−V_DET(S)
− 0.022
−V_DET(S)
−V_DET(S)
+ 0.022
V
1
−V_DET(S)
× 0.99
−V_DET(S)
−V_DET(S)
× 1.01
V
1
Hysteresis width
V_HYS
−
−V_DET
× 0.03
−V_DET
× 0.05
−V_DET
× 0.07
V
1
Current consumption I_SS
Operation voltage
V_DD
Output current
I_OUT
V_DD = −V_DET(S) + 1.0 V
−
0.50 0.90
μA
2
−
0.95
−
10.0
V
1
Output transistor VDD = 0.95 V
0.59 1.00
−
mA 3
Nch
V_DS^*2 = 0.5 V
MR pin active
V_DD = 1.2 V
V_DD = 2.4 V
V_DD = 4.8 V
0.73 1.33
−
mA 3
1.47 2.39
−
mA 3
1.86 2.50
−
mA 3
Output transistor ^{VDD = 4.8 V}
1.62
Pch
S-1003Cx12 to 43
2.60
−
mA 5
V_DS^*2 = 0.5 V
V_DD = 6.0 V
1.78 2.86
−
mA 5
Delay time^*3
Detection voltage
temperature
coefficient^*4
t_D
C_D = 4.7 nF
Δ−V_DET
ΔTa • −V_DET
Ta = −40°C to +85°C
8.5
10.0 11.5
ms 4
−
±100 ±350 ppm/°C 1
MR pin
input voltage "H"
V_MRH
CA type
(MR pin logic active "L")
CB type
(MR pin logic active "H")
V_DD
− 0.3
−
1.2
−
−
V
6
−
V
6
MR pin
input voltage "L"
V_MRL
CA type
(MR pin logic active "L")
CB type
(MR pin logic active "H")
−
−
V_DD
− 1.2
V
6
−
−
0.3
V
6
MR pin
input resistance
R_MR
−
0.5
1.0
1.6
MΩ 6
*1. −V_DET: Actual detection voltage value, −V_DET(S): Set detection voltage value (the center value of the detection voltage
range in Table 5 or Table 6.)
*2. V_DS: Drain-to-source voltage of the output transistor
*3. The time period from when the pulse voltage of 0.95 V → −V_DET(S) + 1.0 V is applied to the VDD pin to when V_OUT
reaches V_DD × 0.9.
*4. The temperature change of the detection voltage [mV/°C] is calculated by using the following equation.
Δ − V_DET
ΔTa
[mV/°C]^*1 = −VDET(S) (typ.)[V]^*2 ×
Δ − V_DET
ΔTa • −V_DET
[ppm/°C]^*3 ÷ 1000
*1. Temperature change of the detection voltage
*2. Set detection voltage
*3. Detection voltage temperature coefficient
12
Seiko Instruments Inc.