RX23T Datasheet, PDF (75/98 Pages) Renesas Technology Corp – 40-MHz 32-bit RX MCUs, built-in FPU, 65.6 DMIPS

RX23T Group
5. Electrical Characteristics
5.4 A/D Conversion Characteristics
Table 5.28 A/D Conversion Characteristics (1)
Conditions: VCC = 4.5 V to 5.5 V, AVCC0 = VREFH0 = VCC to 5.5 V, VSS = AVSS0 = VREFL0 = 0 V, T_a = –40 to +105°C
Item
Min.
Typ.
Max.
Unit
Test Conditions
Frequency
1
—
40
MHz
Resolution
—
—
12
Bit
Conversion time*¹
Permissible signal
1.00
—
—
μs
High-precision channel
(Operation at
source impedance
ADSSTRn.SST[7:0] bits = 08h
PCLKD = 40 MHz)
(Max.) = 1.0 kΩ
Sample-and-hold circuit
1.25
—
—
μs
Normal-precision channel
ADSSTRn.SST[7:0] bits = 12h
not in use
Permissible signal
1.65
—
—
μs
High-precision channel
source impedance
ADSSTRn.SST[7:0] bits = 08h
(Max.) = 1.0 kΩ /
ADSHCR.SSTSH[7:0] bits = 0Dh
Sample-and-hold circuit
AN000 to AN002 = 0.25 V to
in use
VREFH0 – 0.25 V
Analog input capacitance
—
—
12
pF
Offset error
—
—
±6.5
LSB
Full-scale error
—
—
±6.5
LSB
Quantization error
—
±0.5
—
LSB
Absolute accuracy
—
—
±8.0
LSB
DNL differential nonlinearity error
—
±0.5
±1.5
LSB
INL integral nonlinearity error
—
±2.0
±4.0
LSB
Note:
Note 1.
The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential nonlinearity error, and INL integral nonlinearity error do not
include quantization errors.
The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
R01DS0248EJ0110 Rev.1.10
Jan 13, 2016
Page 75 of 98