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| MC9S12B128_05 Datasheet, PDF (101/132 Pages) Motorola, Inc – Covers also preliminary MC9S12B64 using MC9S12B128 die | |||
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Device User Guide â9S12B128DGV1/D V01.13
3. Maximum Erase and Programming times are achieved under particular combinations of fNVMOP and bus frequency fbus.
Refer to formulae in Sections A.3.1.1 - A.3.1.4 for guidance.
4. Burst Programming operations are not applicable to EEPROM
5. Minimum Erase times are achieved under maximum NVM operating frequency fNVMOP.
6. Minimum time, if first word in the array is not blank
7. Maximum time to complete check on an erased block
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed
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