4082F Datasheet, PDF (7/23 Pages) Keysight Technologies – Flash Memory Cell Parametric Test System

07 | Keysight | 4082F Flash Memory Cell Parametric Test System – Data Sheet
Optional high frequency (HF) ports
Maximum number of instrument ports
Maximum residual resistance
Optional HF port bandwidth (@ –3 dB)
Optional HF port cross talk between pins
Six ports for external instruments.
HF ports 1 through 3 can access measurement pins 1 through 24, and HF ports 4 through 6 can access
measurement pins 25 through 48. The user has the option of connecting any of the following HF port
pairs together via a 1 TO 2 cable in order to access all (1 through 48) measurement pins: HF ports 1 and
4, HF ports 2 and 5, and HF ports 3 and 6.
2.0 Ω (supplemental characteristics)
60 MHz (50 Ω load impedance: from port to DUT pin, 3 × 24 coniguration, supplemental characteristics)
±2% (5 kΩ load impedance: from port to DUT pin, 20 ns pulse transition time, supplemental characteristics)
Testhead Circuit Diagram