4082F Datasheet, PDF (19/23 Pages) Keysight Technologies – Flash Memory Cell Parametric Test System

19 | Keysight | 4082F Flash Memory Cell Parametric Test System – Data Sheet
Pulse Force Unit
Speciications
Supported pulse generators
Installable HV-SPGU modules
Channels per HV-SPGU module
Pulse force mode
Output mode
HV-SPGU output impedance
HV-SPGU load impedance
Pulse level (at open load)
Pulse period (at 50 Ω load)
Pulse width (at 50 Ω load)
Pulse delay (at 50 Ω load)
Transition time (at 50 Ω load)
Transition time minimum (at 50 Ω load)
Pulse amplitude (at open load)
Pulse level resolution (at open load)
Pulse level accuracy (at open load)
Pulse shape accuracy (at 50 Ω load)
Pulse shape accuracy (at 5 kΩ load,
supplemental characteristics)
1. Transition time setting ≤ 10 μs
2. Transition time setting > 10 μs
3. |Vamp| ≤ 10 V (to 50 Ω)
4. 10 V < |Vamp| ≤ 20 V (to 50 Ω)
High-voltage semiconductor pulse generator unit (HV-SPGU) modules
5 maximum
2
Each HV-SPGU module supports 2-level and 3-level pulses
All pulse generator channels (up to 10) can force synchronously
50 Ω
0.1 Ω to 1 MΩ
±40 V (at 2-level and 3-level)
350 ns to 10 s with 10 ns resolution
50 ns to [Period - 50 ns] with 2.5 ns¹ or 10 ns² resolution
0 s to [Period - 75 ns] with 2.5 ns¹ or 10 ns² resolution
20 ns to 400 ms with 2 ns¹ or 8 ns² resolution
20 ns³, 30 ns⁴
0 to 80 V peak-to-peak
0.4 mV (Vout ≤ 10 V)
1.6 mV (Vout > 10 V)
±(2% + 150 mV)
Delay: ±(3% + 1 ns)
Transition time: −5% to (+5% + 35 ns)
Overshoot/ringing: + (5% of amplitude +20 mV)
Skew between pins: ±10 ns
Transition time: −5% to (+5% + 35 ns)
Overshoot/ringing: ±(5% of amplitude +20 mV)
Skew between pins: ±10 ns