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| 4082F Datasheet, PDF (5/23 Pages) Keysight Technologies – Flash Memory Cell Parametric Test System | |||
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05 | Keysight | 4082F Flash Memory Cell Parametric Test System â Data Sheet
Speciication
Speciication conditions
Accuracy is speciied under the conditions below.
Speciication conditions
Temperature
Humidity
23°C ± 5°C
15% to 70% RH1
Warm up time
At least 60 min.
Self-calibration
Integration time
Within one hour after calibration
Medium or long2
1. 5% to 60% RH (no condensation) for current measurement accuracy of the HRSMU in 10 pA to
100 nA range and isolation resistance of the low-current port
2. For SMU current ranges that are less than or equal to 1 nA, the integration time must be Long
(16 PLC or longer). Note: The temperature changes after calibration must be less than 3° C.
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