4082F Datasheet, PDF (4/23 Pages) Keysight Technologies – Flash Memory Cell Parametric Test System

04 | Keysight | 4082F Flash Memory Cell Parametric Test System – Data Sheet
High frequency pulse force
The 4082F cabinet supports an optional high-voltage semiconductor pulse generator unit (HV-SPGU) mainframe that contains the SPGU modules.
Maximum number of installable HV-SPGU modules
5
Number of channels per HV-SPGU modules
2
Pulse level support
Each HV-SPGU channel supports 2-level and 3-level pulses
Pulse level (at open load)
±40 V (at 2-level and 3-level)
Pulse period (at 50 Ω load)
350 ns to 10 s with 10 ns resolution
Pulse width (at 50 Ω load)
Pulse delay (at 50 Ω load)
50 ns to [Period - 50 ns] with 2.5 ns¹ or 10 ns² resolution
0 s to [Period - 75 ns] with 2.5 ns¹ or 10 ns² resolution
Transition time setting range (at 50 Ω load)
20 ns to 400 ms with 2 ns¹ or 8 ns² resolution
Transition time minimum (at 50 Ω load)
20 ns³, 30 ns⁴
Switching matrix
Number of measurement pins
Between 12 and 48 pins
Note: One additional pin is dedicated for the prober chuck connection.
Instrument ports
Up to eight SMUs
One ground unit (GNDU)
Eight auxiliary (AUX) ports (Two ports are used for HS-CMU)
48 extended paths
Six optional high-frequency (HF) ports and pulse switch input/output ports
1. Transition time setting ≤ 10 μs
2. Transition time setting > 10 μs
3. |Vamp| ≤ 10 V (to 50 Ω)
4. 10 V < |Vamp| ≤ 20 V (to 50 Ω)