4082F Datasheet, PDF (22/23 Pages) Keysight Technologies – Flash Memory Cell Parametric Test System

22 | Keysight | 4082F Flash Memory Cell Parametric Test System – Data Sheet
Recommended Conditions for Ultra-Low Current and
Low Voltage Measurements¹
In addition to the conditions listed in general speciications, Keysight Technologies
recommends that the following additional conditions be satisied for measuring precise
low current and low voltage with the 4082F.
Recommended conditions for ultra-low current and low voltage measurements
Probe cards²
JEM and MJC
Temperature
Within ±1 °C after calibration
Temperature change period
≥ 10 minutes
Humidity
≤ 50%
Warm up time
≥ 60 minutes
Floor vibration
≤ 1 mG
Floor vibration frequency
≥ 10 Hz
Air cleanliness
≤ class 10,000
Line voltage
Burst noise ≤ 1 kV
Surge noise ≤ 1 kV
This line voltage environment applies EN61326–1
1. The information is this section applies only to systems conigured with ultra-low current matrix cards
and a high-resolution SMU.
2. Please contact your local sales representative regarding the latest information on recommended
probers and probe cards.