4082F Datasheet, PDF (17/23 Pages) Keysight Technologies – Flash Memory Cell Parametric Test System

17 | Keysight | 4082F Flash Memory Cell Parametric Test System – Data Sheet
Z/q measurement accuracy (Supplemental characteristics)
Frequency
1 MHz
100 kHz
C range
10 kΩ
1 kΩ
100 Ω
100 kΩ
10 kΩ
1 kΩ
100 Ω
C accuracy
±(% of reading + % of range)
0.8% + 1.8%
0.7% + 0.6%
1.5% + 0.5%
0.4% + 1.8%
0.2% + 0.6%
0.2% + 0.5%
0.5% + 0.5%
10 kHz
1 kHz
100 kΩ
10 kΩ
1 kΩ
100 kΩ
100 kΩ
10 kΩ
1 kΩ
0.3% + 0.3%
0.2% + 0.3%
0.2% + 0.3%
0.3% + 0.3%
0.3% + 0.2%
0.3% + 0.2%
0.3% + 0.2%
q accuracy
±0.26 rad
±0.02 rad
±0.02 rad
±0.03 rad
±0.01 rad
±0.01 rad
±0.01 rad
±0.01 rad
±0.01 rad
±0.01 rad
±0.01 rad
±0.01 rad
±0.01 rad
±0.01 rad
Keysight E4980A LCR meter
Measurement accuracy is speciied between any two measurement pins except the
chuck connection pin and after calibration data measurement and offset cancel.
Speciications
Measurement range
Measurement frequency
Test signal level
DC bias
Full-scale voltage range
Force accuracy
Bias current isolation function
1 fF to 1.2 nF and 10 nS to 7.5 mS (1 MHz)
1 fF to 10 nF and 1 nS to 6.3 mS (100 kHz)
1 fF to 100 nF and 0.1 nS to 6.3 mS (10 kHz)
10 fF to 100 nF and 0.1 nS to 0.63 mS (1 kHz)
1 kHz, 10 kHz, 100 kHz, and 1 MHz
30 mV (rms)
±40 V
±(0.1% of setting + 10 mV)
OFF
Note: Above speciications are valid after calibration data measurement and offset cancel.