4082F Datasheet, PDF (2/23 Pages) Keysight Technologies – Flash Memory Cell Parametric Test System

Introduction
The Keysight Technologies, Inc. 4082F lash memory cell parametric test system is
designed to perform fast and precise DC measurements, capacitance measurements,
lash cell test and other high frequency applications such as ring oscillator measure-
ment. The system supports up to eight source monitor units (SMUs). Each SMU is
self-calibrating, and can be individually conigured to force either current or voltage,
as well as simultaneously measure either current or voltage. The system also sup-
ports a fully guarded switching matrix customizable from 12 to 48 pins. One special
additional pin is dedicated as a chuck connection.
The 4082F comes standard with a semiconductor pulse generator unit (SPGU)
mainframe that supports up to ive high-voltage SPGUs (HV-SPGUs). An optional
Keysight 4082F lash memory cell parametric test system high-frequency switching
matrix with integrated semiconductor pulse generator unit control is also available.
The HF matrix is organized as two 3 x 24 matrices (six inputs in total), and 1 TO 2
furnished cables may be used on each matrix pair to create a 3 x 48 matrix (three
inputs in total). The system also has one 1.6 A ground unit.
Contents
General Description . . . . . . . . . . . . . . 3
Speciication . . . . . . . . . . . . . . . . . . . . 5
Switching Matrix Subsystem . . . . . . . 6
DC Measurement Subsystem . . . . . 10
Capacitance Measurement
Subsystem . . . . . . . . . . . . . . . . . . . . . 16
Pulse Force Unit . . . . . . . . . . . . . . . . 19
Software . . . . . . . . . . . . . . . . . . . . . . 20
General Speciications . . . . . . . . . . . 21
Recommended Conditions for
Ultra-Low Current and Low
Voltage Measurements . . . . . . . . . . . 22