4082F Datasheet, PDF (21/23 Pages) Keysight Technologies – Flash Memory Cell Parametric Test System

21 | Keysight | 4082F Flash Memory Cell Parametric Test System – Data Sheet
General Speciications
Operating and storage requirements
Warm up time
At least 60 minutes
Temperature range
Operating
5 °C to 30 °C (no condensation)
Storage
–20 °C to 50 °C
–20 °C to 60 °C (for an unpacked system)
Humidity range
Operating
15% to 70% (no condensation)
Storage
< 80% RH (no condensation)
< 90% RH, < 12 hrs (for an unpacked system)
Power requirement
Nominal line voltage¹
200 Vac
208 Vac
220 Vac
240 Vac
Allowable voltage range
180 - 220 Vac
188 - 228 Vac
198 - 242 Vac
216 - 252 Vac
Required maximum current
30 A
24 A
30 A
30 A
Regulatory and standard compliance
EMC
EMC Directive (2004/108/EC)
EN 61326-1
ICES/NMB-001
AS/NZS CISPR 11
Safety
Certiications
Low Voltage Directive (2006/95/EC)
IEC 61010-1:2001/EN 61010-1:2001
CAN/CSA-C22.2 No. 61010-1-04, C/US
SEMI S2-0703/S8-1103
CE, CSA C/US, C-tick, ICES/NMB-001
Dimensions
System cabinet
294 kg (including 3458A, SPGU with 5 x HV-SPGU, system controller)
Test head
166 kg (including 7 MPSMUs, 1 HPSMU, 1 HS-CMU, 48 pins, HF matrix, RF matrix, manipulator
extension shelf and PNA (E8363C) with enclosure, fan, and duct)
Supported probers and recommended probe cards²
Prober
TEL P12XL and Precio
Probe card³
ACCRETECH UF3000 and UF3000EX
JEM (Japan Electronic Material)
MJC (Micronics Japan Co.)
SV Probe
FormFactor
1. Line frequency must be 48 Hz to 63 Hz.
2. Please contact your local sales representative regarding the latest information on recommended probers and probe cards.