4082F Datasheet, PDF (20/23 Pages) Keysight Technologies – Flash Memory Cell Parametric Test System

20 | Keysight | 4082F Flash Memory Cell Parametric Test System – Data Sheet
Software
System software
Standard 4080 software provides the following capabilities
System management
Control of subsystems (TIS library)
Parameter measurement utility (PARA library)
Off-line debugging
Interactive debugging panel (IDP: Includes test algorithm code generating function)
Automatic diagnostics
Keysight SPECS (Semiconductor process evaluation core software)
Keysight SPECS is a test shell environment for the 4080 series. Users have full access to
the Linux environment from within the test shell. The 4080 series requires SPECS version
D.03.10 or later.
Test development
Customization
Analysis & output
User interaction occurs via a graphical interface with spreadsheet-like
operation. Test plans require simple speciications: wafer, die, test, and
probe.
Keysight supplies basic development,engineering, and operator test
shell frameworks, which users can tailor or modify to create entirely new
frameworks.
All data is output into a lat ASCII ile which users can manipulate to allow
for input into database software. In addition, the data management
structure supports x-y graphs, histograms, and wafer maps.
Keysight SPECS-FA
SPECS-FA, the factory automation version of Keysight’s SPECS test shell, runs on all
models of the 4080 Series tester family. SPECS-FA fully supports SEMI automation
standards E5 (SECS II), E30 (GEM), E87 (CMS), E39 (OSS), E40 (PMS),
E90 (STS), and E94 (CJM).
Parallel test capability
4080 series testers support both synchronous and asynchronous parallel test. Keysight
SPECS and SPECS-FA support a powerful virtual multiple testhead technology that
enables separate measurement threads to run completely independently of one another.
This eliminates measurement “dead time” (time spent waiting for other measurement
threads to complete) and maximizes throughput.